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Volumn 89, Issue 12, 2006, Pages

Dependence of crystal structure and work function of WNX films on the nitrogen content

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; GRAIN SIZE AND SHAPE; NITROGEN; SILICA; TUNGSTEN COMPOUNDS;

EID: 33748970897     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2349313     Document Type: Article
Times cited : (56)

References (19)
  • 1
    • 0004245602 scopus 로고    scopus 로고
    • (Semiconductor Industry Association, San Jose), Front End Processes Section
    • The International Technology Roadmap for Semiconductors (Semiconductor Industry Association, San Jose, 2001), Front End Processes Section, p. 25.
    • (2001) The International Technology Roadmap for Semiconductors , pp. 25
  • 11
    • 33748962697 scopus 로고    scopus 로고
    • ICDD PDF 04-0806 (unpublished)
    • ICDD PDF 04-0806 (unpublished).
  • 12
    • 33748968995 scopus 로고    scopus 로고
    • ICDD PDF 25-1257 (unpublished)
    • ICDD PDF 25-1257 (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.