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Volumn 600, Issue 18, 2006, Pages 3766-3769
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Formation of Ti and TiN ultra-thin films on Si by ion beam sputter deposition
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Author keywords
Sputter deposition; Titanium; Titanium nitride; X ray photoelectron spectroscopy (XPS)
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Indexed keywords
ELECTRON EMISSION;
ION BEAM ASSISTED DEPOSITION;
RADIATION;
SILICON;
SPUTTER DEPOSITION;
TITANIUM NITRIDE;
X RAY PHOTOELECTRON SPECTROSCOPY;
AUGER ELECTRONS;
ELEMENTAL COMPOSITION;
ION BEAM SPUTTERING;
SILICON SUBSTRATES;
ULTRATHIN FILMS;
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EID: 33748922073
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2006.01.080 Document Type: Article |
Times cited : (4)
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References (12)
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