Surface morphology of ErP layers on InP and Ga0.52In0.48P

Thin Solid Films

Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 543-546

  Koizumi, Atsushi ^a   Ohnishi, Hiroyuki ^a   Inoue, Tomohiro ^a   Yamauchi, Takeshi ^b   Yamakawa, Ichirou ^a   Ofuchi, Hironori ^a   Tabuchi, Masao ^a   Nakamura, Arao ^a,b   Takeda, Yoshikazu ^a,b  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

AFM; ErP; EXAFS; GaInP; OMVPE; RBS

Indexed keywords

ABSORPTION; ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; INDIUM COMPOUNDS; METALLORGANIC VAPOR PHASE EPITAXY; SEMICONDUCTING GALLIUM COMPOUNDS;

EXAFS; GAINP; RBS;

ERBIUM COMPOUNDS;

EID: 33748745474     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.290     Document Type: Article

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