Analysis and optimization of gate leakage current of power gating circuits

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 2006, Issue , 2006, Pages 565-569

  Kim, Hyung Ock ^a   Shin, Youngsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

MOSFET DEVICES; OPTIMIZATION; POWER SUPPLY CIRCUITS; THRESHOLD VOLTAGE;

GATE OXIDE; POWER GATING CIRCUITS; SUBTHRESHOLD LEAKAGE CURRENT;

LEAKAGE CURRENTS;

EID: 33748617571     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1118299.1118434     Document Type: Conference Paper

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