Study on the use of white light interferometry for multifiber-end surface profile measurement

Optical Engineering

Volumn 45, Issue 5, 2006, Pages

  Quan, C ^a   Wang, S H ^a   Tay, C J ^a   Reading, I ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY   (Singapore)

Author keywords

Michelson interferometric microscope; Microcomponents; Multifiber array; Three dimensional whole field inspection; White light interferometry

Indexed keywords

LIGHT INTERFERENCE; OPTICAL FIBERS; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; REFLECTION;

MICHELSON INTERFEROMETRIC MICROSCOPE; MICROCOMPONENTS; MULTIFIBER ARRAY; WHITE LIGHT INTERFEROMETRY; WHOLE FIELD INSPECTION;

INTERFEROMETRY;

EID: 33748610296     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.2205892     Document Type: Article

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