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Volumn 48, Issue 2, 2001, Pages 279-302

Theory for double beam interference microscopes with coherence effects and verification using the linnik microscope

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COHERENT LIGHT; DISPERSIONS; IMAGING SYSTEMS; INTERFEROMETRY; LIGHT INTERFERENCE; MICROSCOPES; OBJECT RECOGNITION; OPTICAL BEAM SPLITTERS; OPTICAL GLASS; OPTICAL INSTRUMENT LENSES; THEOREM PROVING;

EID: 0035866464     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340108232458     Document Type: Article
Times cited : (47)

References (23)
  • 4
    • 0000115171 scopus 로고
    • Integrated Circuits Metrology, Inspection, and Process Control
    • Monahan K.M., (ed)
    • Davidson, M., Kaufman, K., Mazor, I., and Cohen, F., 1987. “ Integrated Circuits Metrology, Inspection, and Process Control ”. In Proc. SPIE Edited by:Monahan, K. M., Vol. 775, 2333
    • (1987) Proc. SPIE , vol.775 , pp. 2333
    • Davidson, M.1    Kaufman, K.2    Mazor, I.3    Cohen, F.4
  • 7
    • 0011771825 scopus 로고
    • Krug W., Rienitz J., Schultz G., (eds), London: Hilger and Watts
    • Schultz, G., 1964. Contributions to Interference Microscopy, Edited by:Krug, W., Rienitz, J., and Schultz, G., 308–308. London:Hilger and Watts.
    • (1964) Contributions to Interference Microscopy , pp. 308
    • Schultz, G.1
  • 19
    • 85023907663 scopus 로고
    • Wolf E., (ed), New York: Elsevier, Chap. 5
    • Creath, K., 1988. Progress in Optics XXVI, Edited by:Wolf, E., New York:Elsevier. Chap. 5.
    • (1988) Progress in Optics XXVI
    • Creath, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.