Measurement of a fiber-end surface profile by use of phase-shifting laser interferometry

Applied Optics

Volumn 43, Issue 1, 2004, Pages 49-56

  Wang, Shihua ^a   Quan, Chenggen ^a   Tay, Cho Jui ^a   Reading, Ivan ^b   Fang, Zhongping ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; INTERFEROMETRY; LIGHT REFLECTION; OPTICAL FIBERS; OPTICAL VARIABLES MEASUREMENT; PATTERN RECOGNITION; PHASE SHIFT;

FIBER END SURFACE PROFILE MEASUREMENT; INTERFERENCE FRINGE PATTERN; PHASE SHIFTING LASER INTERFEROMETRY; STYLUS PROFILOMETERS; WHITE LIGHT INTERFEROMETERS;

LASER APPLICATIONS;

EID: 0346639133     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.000049     Document Type: Article

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