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Volumn 351, Issue 1, 2005, Pages 54-60

Photo-induced phenomena in sputtered GeO2 films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EXCIMER LASERS; IRRADIATION; MICROSCOPIC EXAMINATION; OPTICAL FIBERS; RADIATION; REFRACTIVE INDEX; SURFACE ROUGHNESS;

EID: 10644249244     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2004.10.002     Document Type: Conference Paper
Times cited : (33)

References (39)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.