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Volumn 480-481, Issue , 2005, Pages 13-20

Structural modifications in thin films caused by gamma radiation

Author keywords

Gamma radiation; Metal oxides; Raman spectra; Thin film; XRD

Indexed keywords

AGGLOMERATION; GAMMA RAYS; MICROSTRUCTURE; RAMAN SCATTERING; THIN FILMS; X RAY DIFFRACTION;

EID: 33748145009     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-962-8.13     Document Type: Conference Paper
Times cited : (12)

References (20)
  • 3
    • 1542269542 scopus 로고    scopus 로고
    • K. Arshak, O. Korostynska and F. Fahim: Sensors 3 (2003), p. 176.
    • K. Arshak, O. Korostynska and F. Fahim: Sensors Vol. 3 (2003), p. 176.
  • 10
    • 0004277028 scopus 로고
    • Robert E. Krieger Publishing Company, Florida
    • K.L. Chopra: Thin film phenomena (Robert E. Krieger Publishing Company, Florida 1979).
    • (1979) Thin film phenomena
    • Chopra, K.L.1
  • 15
    • 0000845773 scopus 로고    scopus 로고
    • K. Tominaga et al: Vacuum Vol. 59 (2000), p. 546.
    • (2000) Vacuum , vol.59 , pp. 546
    • Tominaga, K.1
  • 16
    • 1542269543 scopus 로고    scopus 로고
    • K. Arshak and K. Twomey: Sensors 2 (2002), p. 205.
    • K. Arshak and K. Twomey: Sensors Vol. 2 (2002), p. 205.
  • 19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.