Electronic system reliability: Collating prediction models

IEEE Transactions on Device and Materials Reliability

Volumn 6, Issue 2, 2006, Pages 258-265

  Goel, Anuj ^a,b   Graves, Robert T ^a,c  

^a IEEE   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c DARTMOUTH COLLEGE   (United States)

Author keywords

Electronic component reliability; Empiricalbased models; Failure rate; MIL HDBK 217; Physics of failure; Prediction models

Indexed keywords

ELECTRONIC COMPONENT RELIABILITY; EMPIRICALBASED MODELS; FAILURE RATES; MIL-HDBK-217; PHYSICS-OF-FAILURE; PREDICTION MODELS;

FAILURE ANALYSIS; MATHEMATICAL MODELS; RELIABILITY; SYSTEMS ANALYSIS;

ELECTRONIC EQUIPMENT;

EID: 33748102634     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2006.876570     Document Type: Conference Paper

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