A review of reliability prediction methods for electronic devices

Microelectronics Reliability

Volumn 42, Issue 8, 2002, Pages 1155-1162

  Foucher, B ^a   Boullie J ^a,c   Meslet, B ^b,d   Das, D ^b  

^a AIRBUS GROUP INNOVATIONS   (Germany)

^b UNIVERSITY OF MARYLAND   (United States)

^c THALES ALENIA SPACE   (France)

^d Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE INDUSTRY; DATABASE SYSTEMS; MANAGEMENT SCIENCE; PRODUCT DEVELOPMENT; RELIABILITY THEORY; STATISTICAL METHODS;

RELIABILITY PREDICTION METHODS;

MICROELECTRONICS;

EID: 0036681867     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00087-2     Document Type: Article

References (30)

1. Rebuttal to: A critique of the reliability-analysis-center failure-rate-model for plastic encapsulated microcircuits
2. Development and activities of the IEEE reliability standards group
3. A critique of the reliability-analysis-center failure-rate-model for plastic encapsulated microcircuits
4. A survey of reliability prediction procedures for microelectronic devices
5. On US Mil-Hdbk-217 and reliability prediction
6. Failure prediction methodology calculations can mislead: Use them wisely, not blindly
7. What is wrong with the existing reliability prediction methods?
8. A change in direction for reliability engineering is long overdue
9. Reliability prediction procedure for electronic equipment
10. Siemens technical liaison and standardization
11. In-service reliability assessment and top-down approach provides alternative reliability prediction method
12. Improvements in reliability assessment and prediction methodology
13. An other way to assess electronics part reliability
14. A new prediction-methodology on avionics embedded electronics: Why? how?
15. Failure assessment software for circuit card assemblies
16. Fatigue and intermetallic formation in lead free solder die attach
17. A web-based graduate course on the mechanical design of high temperature and high power electronics
18. Are components still a major problem? A review of electronic systems and device field failure returns
19. The history of reliability prediction
20. A comparison of electronic reliability prediction models
21. Criteria for the assessment of reliability models