The IEEE standards on reliability program and reliability prediction methods for electronic equipment

Microelectronics Reliability

Volumn 42, Issue 9-11, 2002, Pages 1259-1266

  Pecht, Michael ^a   Das, Diganta ^a   Ramakrishnan, Arun ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FORECASTING; LIFE CYCLE; OSCILLATORS (ELECTRONIC); RELIABILITY; RISK ASSESSMENT; SALES;

APPLICATION ENVIRONMENT; CUSTOMER REQUIREMENTS; PERFORMANCE LIMITS; RELIABILITY PREDICTION;

IEEE STANDARDS;

EID: 1242320877     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(02)00132-4     Document Type: Conference Paper

References (36)

1. Henney K. Reliability factors for ground electronic equipment. McGraw-Hill, New York, 1956.
2. RCA release TR-1100: Reliability Stress Analysis for Electronic Equipment, U.S. Dept. of Commerce, Office of Technical Services, Washington D.C., 1956.
3. US MIL-HDBK 217. Reliability Prediction of Electronic Equipment (version A), 1965.
4. Denson WA. Tutorial: PRISM. RAC Journal. 1999; 1-6.
5. Telcordia Technologies, Special Report SR-332: Reliability Prediction Procedure for Electronic Equipment (Issue 1). Telcordia Customer Service. Piscataway, N. J., 2001.
6. SAE G-ll Committee. Aerospace Information Report on Reliability Prediction Methodologies for Electronic Equipment AIR5286. Draft Report,. 1998.
7. Union Technique de L'Electricite, Recueil de donnees des fiabilite: RDF 2000. Modele universel pour le calcul de la fiabilite previsionnelle des composants, cartes et equipements electroniques, 2000.
8. Siemens AG. Siemens Company Standard SN29500 (Version 6.0). Failure Rates of Electronic Components. Siemens Technical Liaison and Standardization, 1999.
9. British Telecom. Handbook of Reliability Data for Components Used in Telecommunication Systems 1987.
10. PechtM, NashF. Predicting the Reliability of Electronic Equipment. Proc. IEEE. 1994; 82: 992-1004.
11. Bowles JB. A Survey of Reliability-Prediction Procedures for Microelectronic Devices. IEEE Trans. Reliab. 1992; 41: 2-12.
12. Cushing MJ, Mortin DE, Stadterman TJ, MalhotraA. Comparison of Electronics-Reliability Assessment Approaches. IEEE Trans. Reliab. 1993; 42: 542-546.
13. O'Connor PDT. Reliability Prediction: Help or Hoax? Solid State Technology. 1990; 33: 59-61.
14. TalmorM, Arueti S. Reliability Prediction: The Turn-over Point. 1997 Proc. Ann. Reliability and Maintainability Symp. 1997: 254-262.
15. Spencer J. The Highs and Lows of Reliability Prediction. 1986 Proc. Ann. Reliability and Maintainability Symp. 1986: 156-162.
16. Jones J, Hayes J. A Comparison of Electronic Reliability Prediction Models. IEEE Trans. Reliab. 1999; 48: 127-134.
17. Thurman W. Address to the Fifth National Symposium on Reliability and Quality Control. IRE Trans. Reliab. Qual. Contr. 1959; 8: 1-6.
18. (Reprinted in IEEE Trans. Components and Packaging Technology. 1999; 22: 594-596.)
19. Cushing MJ, Krolewski JG, Stadterman TJ, HumBT. U.S. Army Reliability Standardization Improvement Policy and Its Impact. IEEE Trans. Components, Packaging, and Manufacturing Technology: Part A. 1996; 19: 277-278. (Pubitemid 126794303)
20. Morris SF. Use and Application of MIL-HDBK-217. Solid State Technology. 1990; 65-69 .
21. Leonard C. MIL-HDBK-217: It's Time to Rethink It. Electronic Design. 1991; 79-82.
22. PechtM, Hakim EB. The Future of Military Standards - A Focus on Electronics. IEEE Aerospace and Electronic Systems. 1993; 17: 16-19.
23. Pecht M, Shukla A, Kelkar N, Pecht J. Criteria for the Assessment of Reliability Models. IEEE Trans. Components, Packaging, and Manufacturing Technology: PartB. 1997; 20: 229-234.
24. Pecht M. Why the Traditional Reliability Prediction Models Do Not Work - Is There an Alternative? Electronics Cooling. 1996; 2: 10-12.
25. O'Connor PDT. Undue Faith in US Mil-Hdbk-217 for Reliability Prediction. IEEE Trans. Reliab. 1988; 37: 468.
26. Knowles I. Is It Time For a New Approach? IEEE Trans. Reliab. 1993; 42: 3.
27. Leonard C. On US MIL-HDBK-217 and Reliability Prediction. IEEE Trans. Reliab. 1998; 37: 450-451.
28. LuthraP. Mil-Hdbk 217: What is Wrong with it? IEEE Trans. Reliab. 1990; 39: 518.
29. Pease R. What's All These Mil-Hdbk-217 Stuff Anyhow? Electronic Design, 1991; 82-84.
30. Wong KL. What Is Wrong with the Existing Reliability Prediction Methods? Quality and Reliability Engineering International. 1990; 6: 251-257.
31. Cartwright J, Donahoe DN. Jackson M. Reliability Prediction and Assessment of Electronic Systems and Equipment. IEEE Trans. Components, Packaging, and Manufacturing Technology: Part A. 1999; 22: 127-128.
32. IEEE Standard Reliability Program for the Development and Production of Electronic Systems and Equipment. IEEE Std. 1332, New York, 1998.
33. SAE. JA 1000 Reliability Program Standard, Warrandale, PA, 1998.
34. SAE. JA 1000/1 Reliability Program Standard Implementation Guide, Warrandale, PA, 1999.
35. Ministry of Defence, United Kingdom, Defence Standard 00-40 (Part 1) Issue 4, Reliability and Maintainability: Management Responsibilities and Requirements for Programmes and Plans, Glasgow, UK, 1999.
36. IEEE Standard Methodology for Reliability Prediction and Assessment for Electronic Systems and Equipment. IEEE Std. 1413, New York, 1998.