Estimation of system reliability using a "non-constant failure rate" model

IEEE Transactions on Reliability

Volumn 50, Issue 3, 2001, Pages 286-288

  Jones, Jeff ^a,b   Hayes, Joe ^c  

^a IEEE   (United Kingdom)

^b UNIVERSITY OF WARWICK   (United Kingdom)

^c LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Non constant failure rate; System reliability prediction

Indexed keywords

FAILURE INTENSITY ANALYSIS; NON-CONSTANT FAILURE RATE; SYSTEM RELIABILITY;

CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ESTIMATION; FAILURE ANALYSIS; MATHEMATICAL MODELS;

RELIABILITY THEORY;

EID: 0035466239     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.974125     Document Type: Article

References (5)

1. The organization of a study of the field failure of electronic components
2. An analysis of the field failure of passive and active components
3. An exploratory approach to the reliability analysis of electronic component field data
4. How failure prediction methodology affects electronic equipment design
5. Use and application of MIL-HDBK-217