OCCOM - Efficient computation of observability-based code coverage metrics for functional verification

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 20, Issue 8, 2001, Pages 1003-1015

  Fallah, Farzan ^a,b   Devadas, Srinivas ^a,c   Keutzer, Kurt ^a,d  

^a IEEE   (United States)

^b FUJITSU LABORATORIES OF AMERICA   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Code coverage; Functional verification; Observability; OCCOM

Indexed keywords

FLOWGRAPH; OBSERVABILITY-BASED CODE COVERAGE METRICS; TIME-CONSUMING FIRST PHASE; TIME-CONSUMING SECOND PHASE;

ALGORITHMS; CODES (SYMBOLS); COMPUTATIONAL METHODS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; DIFFERENTIATION (CALCULUS); GRAPH THEORY;

COMPUTER AIDED DESIGN;

EID: 0035424905     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.936381     Document Type: Article

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