Scanning electron and atomic force microscopy to study plasma torch effects on B. cereus spores

IEEE Transactions on Plasma Science

Volumn 34, Issue 4 II, 2006, Pages 1281-1289

  Tarasenko, Olga ^a   Nourbakhsh, Said ^b   Kuo, Spencer P ^b   Bakhtina, Asya ^b   Alusta, Pierre ^c   Kudasheva, Dina ^b,d   Cowman, Mary ^b   Levon, Kalle ^b  

^a University of Arkansas at Little Rock   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

^c UNIVERSITY OF ARKANSAS AT LITTLE ROCK   (United States)

^d Luitpold Pharmaceuticals Inc   (United States)

Author keywords

Atomic force microscopy (AFM); Bacillus cereus; Decontamination; Plasma torch; Scanning electron microscopy (SEM)

Indexed keywords

ATOMIC FORCE MICROSCOPY; BACTERIA; DECONTAMINATION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY;

BACILLUS SPORES;

PLASMA TORCHES;

EID: 33747833411     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2006.878378     Document Type: Article

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