Simulation of AFM/LFM by molecular dynamics: Role of lateral force in contact-mode AFM imaging

Surface Science

Volumn 357-358, Issue , 1996, Pages 222-227

  Komiyama, Masaharu ^a   Tsujimichi, Kazuya ^b   Tazawa, Katsuyuki ^b   Hirotani, Akiyasu ^b   Yamano, Hideo ^b   Kubo, Momoji ^b   Broclawik, Ewa ^b   Miyamoto, Akira ^b  

^a UNIVERSITY OF YAMANASHI   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Atom solid interactions; Atomic force microscopy; Copper; Molecular dynamics; Surface relaxation and reconstruction; Surface structure, morphology, roughness, and topography

Indexed keywords

COMPUTER SIMULATION; COPPER; MOLECULAR DYNAMICS; MORPHOLOGY; RELAXATION PROCESSES; SURFACE STRUCTURE; SURFACE TREATMENT;

LATERAL FORCE MICROSCOPY; LATERAL FORCES; STICK SLIP PHENOMENON; TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

EID: 13544249221     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00097-0     Document Type: Article

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