Thickness dependent characteristics of a copper phthalocyanine thin-film transistor investigated by in situ FET measurement system

Molecular Crystals and Liquid Crystals

Volumn 455, Issue 1, 2006, Pages 347-351

  Ikeda, Susumu ^a   Yamakawa, Hidemitsu ^a   Kiguchi, Manabu ^a   Nakayama, Manabu ^a   Saiki, Koichiro ^a   Shimada, Toshihiro ^a   Miyadera, Tetsuhiko ^a   Tsutsui, Ken ^b   Wada, Yasuo ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b WASEDA UNIVERSITY   (Japan)

Author keywords

Copper phthalocyanine; In situ FET measurement; Organic thin film transistor; Thickness dependence

Indexed keywords

COPPER COMPOUNDS; DEPOSITION; ELECTRIC CURRENTS; ELECTRON MOBILITY; FILM GROWTH; TRANSPORT PROPERTIES;

COPPER PHTHALOCYANINE; IN SITU FET MEASUREMENT; ORGANIC THIN-FILM TRANSISTORS; THICKNESS DEPENDENCE;

THIN FILM TRANSISTORS;

EID: 33747616251     PISSN: 15421406     EISSN: 15635287     Source Type: Journal    
DOI: 10.1080/15421400600699004     Document Type: Conference Paper

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