Accumulation and depletion layer thicknesses in organic field effect transistors

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 42, Issue 12 A, 2003, Pages

  Kiguchi, Manabu ^a   Nakayama, Manabu ^a   Fujiwara, Kohei ^a   Ueno, Keiji ^b   Shimada, Toshihiro ^a   Saiki, Koichiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b SAITAMA UNIVERSITY   (Japan)

Author keywords

Accumulation layer; Depletion layer; Field effect transistor; Organic film

Indexed keywords

CHARGE CARRIERS; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRODES; GRAIN SIZE AND SHAPE; SEMICONDUCTING ORGANIC COMPOUNDS; TEMPERATURE; THICKNESS MEASUREMENT; THIN FILM DEVICES;

ACCUMULATION LAYERS; DEPLETION LAYERS; GATE VOLTAGES; INJECTED LAYERS; ORGANIC FIELD EFFECT TRANSISTORS; PENTACENE;

FIELD EFFECT TRANSISTORS;

EID: 0742286297     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.l1408     Document Type: Letter

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