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Applied Physics Letters

Volumn 89, Issue 7, 2006, Pages

Bright-field imaging of lattice distortions using x rays

(6) Yi, J M a Je, J H a Chu, Y S b Zhong, Y b Hwu, Y c Margaritondo, G d

a Pohang University of Science and Technology (POSTECH) (South Korea)

b ARGONNE NATIONAL LABORATORY (United States)

c INSTITUTE OF PHYSICS (Taiwan)

d EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

INHOMOGENEITY EFFECTS; LAUE GEOMETRY; STRAIN EFFECTS; X-RAY TRANSMISSION;

CRYSTAL LATTICES; CRYSTALLINE MATERIALS; ELECTRON SCATTERING; IMAGING TECHNIQUES; SILICON WAFERS; STRAIN MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAYS;

SIGNAL DISTORTION;

EID: 33747518667 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2337528 Document Type: Article

Times cited : (8)

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