Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms

Journal of Applied Physics

Volumn 86, Issue 8, 1999, Pages 4613-4618

  Hwu, Y ^a   Hsieh, H H ^a   Lu, M J ^a   Tsai, W L ^b   Lin, H M ^b   Goh, W C ^c   Lai, B ^d   Je, J H ^e   Kim, C K ^e   Noh, D Y ^f   Youn, H S ^e   Tromba, G ^g   Margaritondo, G ^h  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b TATUNG INSTITUTE OF TECHNOLOGY   (Taiwan)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e Pohang University of Science and Technology (POSTECH)   (South Korea)

^f Gwangju Institute of Science and Technology (GIST)   (South Korea)

^g SINCROTRONE TRIESTE   (Italy)

^h Ecl Polytech Federale de Lausanne   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000447798     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371411     Document Type: Article

References (13)

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