Spectral dependence of the complex refractive index shift across the semiconductor-metal transition in thermally-oxidized vanadium

Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 319-322

  Svitasheva, S N ^a   Kruchinin, V N ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

Inverse ellipsometric problem; Mechanism of oxidation; Phase transition; Spectroscopic ellipsometry; Vanadium dioxide

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELLIPSOMETRY; REFRACTIVE INDEX; THERMAL EFFECTS; THERMOOXIDATION; VANADIUM;

SEMICONDUCTOR METAL TRANSITION;

THIN FILMS;

EID: 0031998219     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00840-7     Document Type: Article

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