Oxygen effects on the interfacial electronic structure of titanyl phthalocyanine film: p-Type doping, band bending and Fermi level alignment

Chemical Physics

Volumn 325, Issue 1, 2006, Pages 121-128

  Nishi, Toshio ^a   Kanai, Kaname ^a   Ouchi, Yukio ^a   Willis, Martin R ^b   Seki, Kazuhiko ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Band bending; Fermi level alignment; Organic semiconductor; Oxygen doping; Titanyl phthalocyanine; Ultraviolet photoelectron spectroscopy

Indexed keywords

EID: 33747047005     PISSN: 03010104     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chemphys.2006.02.004     Document Type: Article

References (40)

1. Kuroda H., and Flood E.A. Can. J. Chem. 39 (1961) 1475
2. Maruyama Y., and Inokuchi H. Bull. Chem. Soc. Jpn. 39 (1966) 1418
3. Martin M.M., Andre J.J., and Simon J. J. Appl. Phys. 54 (1983) 2792
4. Sussman A. J. Appl. Phys. 38 (1967) 2748
5. Heilmeier G.H., and Harrison S.E. Phys. Rev. 132 (1963) 2010
6. van Oirschot G.J., van Leeuwen D., and Medema J. J. Electroanal. Chem. 37 (1972) 373
7. Simon J., and Andre J.J. Molecular Semiconductors (1985), Springer-Verlag, Berlin pp. 112-116
8. Schlettwein D., and Armstrong N.R. J. Phys. Chem. 98 (1994) 11771
9. Hiramoto M. Jpn. J. Appl. Phys. 42 (2003) 672
10. Ishii H., Sugiyama K., Ito E., and Seki K. Adv. Mater. 11 (1999) 605
11. Vazquez H., Oszwaldowski R., Pou P., Ortega J., Perez R., Flores F., and Kahn A. Europhys. Lett. 65 (2004) 802
12. Vazquez H., Flores F., Oszwaldowski R., Ortega J., Perez R., and Kahn A. Appl. Surf. Sci. 234 (2004) 107
13. Gao W., and Kahn A. Org. Electron. 3 (2002) 53
14. Gao W., and Kahn A. J. Appl. Phys. 94 (2003) 359
15. Gao W., and Kahn A. J. Phys.: Condens. Matter 15 (2003) S2757
16. Tanaka S., Kawabe E., Kanai K., Iwahashi T., Nishi T., Ouchi Y., and Seki K. J. Electron Spectrosc. Relat. Phenom. 144-147 (2005) 535
17. Hayashi N., Ito E., Ishii H., Ouchi Y., and Seki K. Syn. Metals 121 (2001) 1717
18. Oji H., Ito E., Furuta M., Kajikawa K., Ishii H., Ouchi Y., and Seki K. J. Electron Spectrosc. Relat. Phenom. 101 (1999) 517
19. Ito E., Oji H., Furuta M., Ishii H., Oichi K., Ouchi Y., and Seki K. Syn. Metals 101 (1999) 654
20. Seki K., Hayashi N., Oji H., Ito E., Ouchi Y., and Ishii H. Thin Solid Films 393 (2001) 298
21. Hayashi N., Ishii H., Ouchi Y., and Seki K. J. Appl. Phys. 92 (2002) 3784
22. Blochwitz J., Fritz T., Pfeiffer M., Leo K., Alloway D.M., Lee P.A., and Armstrong N.R. Org. Electron. 2 (2001) 97
23. Pfeiffer M., Leo K., Zhou X., Huang J.S., Hofmann M., Werner A., and Blochwitz-Nimoth J. Org. Electron. 4 (2003) 89
24. Ishii H., Hayashi N., Ito E., Washizu Y., Sugi K., Kimura Y., Niwano M., Ouchi Y., and Seki K. Phys. Stat. Sol. 201 (2004) 1075
25. Liu C.J., Peng C.H., Ju Y.H., and Hsieh J.C. Sens. Actuators B 52 (1998) 264
26. Liu C.J., Wang S.Y., Hsieh J.C., and Ju Y.H. Sens. Actuators B 65 (2000) 371
27. Tada H., Touda H., Takada M., and Matsushige K. Appl. Phys. Lett. 76 (2000) 873
28. Klofta T.J., Danziger J., Lee P., Pankow J., Nebesny K.W., and Armstrong N.R. J. Phys. Chem. 91 (1987) 5646
29. Nishi T., Kanai K., Willis M.R., Ouchi Y., and Seki K. Chem. Phys. Lett. 414 (2005) 479
30. Ogawa S., Naijo T., Kimura Y., Ishii H., and Niwano M. Appl. Phys. Lett. 86 (2005) 252104
31. Becke A.D. J. Chem. Phys. 7 (1993) 5648
32. Lyons L.E. J. Chem. Soc. (1957) 5001
33. Sato N., Seki K., and Inokuchi H. J. Chem. Soc. Faraday Trans. 2 77 (1981) 1621
34. Kera S., Abduaini A., Aoki M., Okudaira K.K., Ueno N., Harada Y., Shirota Y., and Tsuzuki T. Thin Solid Films 327-329 (1998) 278
35. Berkowitz J. J. Chem. Phys. 70 (1979) 2819
36. Yanagi H., Chen S., Lee P.A., Nebesny K.W., Armstrong N.R., and Fujishima A. J. Phys. Chem. 100 (1996) 5447
37. Majima Y., Yamagata K., and Iwamoto M. J. Appl. Phys. 86 (1999) 3229
38. Sze S.M. Physics of Semiconductor Devices (1981), Wiley, New York
39. Harima Y., Kodaka T., Okazaki H., Kunugi Y., Yamashita K., Ishii H., and Seki K. Chem. Phys. Lett. 240 (1995) 345
40. Harima Y., Okazaki H., Kunugi Y., Yamashita K., Ishii H., and Seki K. Appl. Phys. Lett. 69 (1996) 1059