Electronic structure of organic/metal interfaces

Thin Solid Films

Volumn 393, Issue 1-2, 2001, Pages 298-303

  Seki, Kazuhiko ^a   Hayashi, Naoki ^a   Oji, Hiroshi ^a   Ito, Eisuke ^a   Ouchi, Yukio ^a   Ishii, Hisao ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Auger; Electron solid diffraction; Epitaxy; Evaporation and sublimation; Interface preparation; LEED; Organic inorganic interfaces; RHEED

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; ELECTRONIC STRUCTURE; EVAPORATION; FERMI LEVEL; FILM PREPARATION; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; PHOTOELECTRON SPECTROSCOPY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBLIMATION; ULTRAHIGH VACUUM;

ELECTRON-SOLID DIFFRACTION;

SURFACE STRUCTURE;

EID: 0035423701     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01094-X     Document Type: Conference Paper

References (26)