Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubes

Scanning

Volumn 28, Issue 4, 2006, Pages 219-227

  Wong, Wai Kin ^a   Nojeh, A ^b   Pease, R F W ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Stanford University   (United States)

Author keywords

Carbon nanotubes; Electron beam induced conductivity; Electron beam specimen interaction; Scanning electron microscopy; Secondary electron emission; Voltage contrast

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON BEAMS; IMAGE PROCESSING; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY;

ELECTRON BEAM-INDUCED CONDUCTIVITY; ELECTRON BEAM-SPECIMEN INTERACTION; SECONDARY ELECTRON EMISSION; VOLTAGE CONTRAST;

CARBON NANOTUBES;

CARBON NANOTUBE;

ARTICLE; CONTRAST SENSITIVITY; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON BEAM; ENERGY; GEOMETRY; IMAGE ANALYSIS; IMAGING SYSTEM; PARAMETER; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY;

ELECTRIC POTENTIAL; IMAGE ANALYSIS; SCANNING ELECTRON MICROSCOPY;

EID: 33746973761     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950280404     Document Type: Article

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