SCOPUS 정보 검색 플랫폼

Scanning

Volumn 19, Issue 7, 1997, Pages 498-504

A novel method for the discharge of electrostatic mirror formations in the scanning electron microscope

(3) Wong, W K a Phang, J C H a Thong, J T L a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

Author keywords

Beam voltage control; Electrostatic mirror discharge; Insulating specimens; Specimen current; Voltage control

Indexed keywords

COMPUTER SIMULATION; ELECTRON BEAMS; ELECTRON SCATTERING; ION BEAMS; MONTE CARLO METHODS;

BEAM CHARGING; CHANNELING; FOCUSED ION BEAM; SCANNING ION MICROSCOPE; SURFACE SPUTTERING;

SCANNING ELECTRON MICROSCOPY;

ALGORITHM; ARTICLE; ELECTRIC POTENTIAL; ELECTRICITY; ELECTRON BEAM; MICROSCOPE IMAGE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SIMULATION; SYSTEM ANALYSIS;

EID: 0031251747 PISSN: 01610457 EISSN: None Source Type: Journal
DOI: 10.1002/sca.4950190708 Document Type: Article

Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.