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Volumn 1, Issue , 2005, Pages 138-141

On the use of titanium nitride as structural material for nano-electro-mechanical systems (NEMS)

Author keywords

Microelectromechanical devices; Photonic switching systems; Stress control; Titanium compounds

Indexed keywords

MECHANICAL PROPERTIES; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY; RESIDUAL STRESSES;

EID: 33746945042     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2005.1500712     Document Type: Conference Paper
Times cited : (10)

References (10)
  • 2
    • 0033417558 scopus 로고    scopus 로고
    • Synthesis of hard TiN coatings with suppressed columnar growth and reduced stress
    • September/October
    • M. M. Lacerda, Y. H. Chen, B. Zhou, M. U. Guruz, and Y. W. Chung, "Synthesis of hard TiN coatings with suppressed columnar growth and reduced stress" Journal of Vacuum Science and Technology A, vol. 17, no. 5, pp. 2915-2919, September/October 1999.
    • (1999) Journal of Vacuum Science and Technology A , vol.17 , Issue.5 , pp. 2915-2919
    • Lacerda, M.M.1    Chen, Y.H.2    Zhou, B.3    Guruz, M.U.4    Chung, Y.W.5
  • 3
    • 0034155923 scopus 로고    scopus 로고
    • Mechanical properties of titanium nitride coatings deposited by inductively coupled plasma assisted direct current magnetron sputtering
    • March/April
    • J. W. Lim, H. S. Park, T. H. Park, J. J. Lee, J. Joo, "Mechanical properties of titanium nitride coatings deposited by inductively coupled plasma assisted direct current magnetron sputtering" Journal of Vacuum Science and Technology A, vol. 18, no. 2, pp. 524-528, March/April 2000.
    • (2000) Journal of Vacuum Science and Technology A , vol.18 , Issue.2 , pp. 524-528
    • Lim, J.W.1    Park, H.S.2    Park, T.H.3    Lee, J.J.4    Joo, J.5
  • 4
    • 0033882382 scopus 로고    scopus 로고
    • The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films
    • March
    • P. Patsalas, C. Charitidis, and S. Logothetidis, "The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films" Surface and Coatings Technology, vol. 125, no. 1-3, pp. 335-340, March 2000.
    • (2000) Surface and Coatings Technology , vol.125 , Issue.1-3 , pp. 335-340
    • Patsalas, P.1    Charitidis, C.2    Logothetidis, S.3
  • 5
    • 84881162072 scopus 로고
    • Structure and properties of titanium nitride thin films deposited at low temperatures using direct current magnetron sputtering
    • March/April
    • F. Elstner, A. Ehrlich, H. Giegengack, H. Kupfer, and F. Richter, "Structure and properties of titanium nitride thin films deposited at low temperatures using direct current magnetron sputtering" Journal of Vacuum Science and Technology A, vol. 12, no. 2, pp. 476-483, March/April 1994.
    • (1994) Journal of Vacuum Science and Technology A , vol.12 , Issue.2 , pp. 476-483
    • Elstner, F.1    Ehrlich, A.2    Giegengack, H.3    Kupfer, H.4    Richter, F.5
  • 7
    • 0031245815 scopus 로고    scopus 로고
    • Characterization of TiN thin films using the bulge test and the nanoindentation technique
    • October
    • A. Karimi, O. R. Shojaei, T. Krumj, and J. L. Martin, "Characterization of TiN thin films using the bulge test and the nanoindentation technique" Thin Solid Films, vol. 308-309, no. 1-4, pp. 334-339, October 1997.
    • (1997) Thin Solid Films , vol.308-309 , Issue.1-4 , pp. 334-339
    • Karimi, A.1    Shojaei, O.R.2    Krumj, T.3    Martin, J.L.4
  • 8
    • 0032202897 scopus 로고    scopus 로고
    • Mechanism of TiN barrier-metal oxidation in a ferroelectric random access memory
    • November
    • K. Kushida-Abdelghafar, K. Torii, S. Takatani, Y. Matsui, and Y. Fujisaki, "Mechanism of TiN barrier-metal oxidation in a ferroelectric random access memory" Electronics Letters, vol. 13, no. 11, pp. 3265-3269, November 1998.
    • (1998) Electronics Letters , vol.13 , Issue.11 , pp. 3265-3269
    • Kushida-Abdelghafar, K.1    Torii, K.2    Takatani, S.3    Matsui, Y.4    Fujisaki, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.