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Volumn 6, Issue 4, 2006, Pages 1016-1021

SOI Hall-sensor front end for energy measurement

Author keywords

Hall sensor; Silicon on insulator (SOI); Solid state energy meter

Indexed keywords

HALL SENSORS; HALL-SENSOR-BASED MICROSYSTEM SOLUTIONS; LINE VOLTAGE; SOLID-STATE ENERGY METER;

EID: 33746900816     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2006.877996     Document Type: Article
Times cited : (29)

References (13)
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    • Popovic, R.S.1
  • 9
    • 27944470085 scopus 로고    scopus 로고
    • SOI Hall sensor based solid state meter for power and energy measurements
    • Oct.
    • M. Blagojevic, D. De Venuto, and M. Kayal, "SOI Hall sensor based solid state meter for power and energy measurements," in Proc, IEEE Sens., Oct. 2004, pp. 1040-1043.
    • (2004) Proc, IEEE Sens. , pp. 1040-1043
    • Blagojevic, M.1    De Venuto, D.2    Kayal, M.3
  • 10
    • 0031169548 scopus 로고    scopus 로고
    • Monolithic magnetic Hall sensor using dynamic quadrature offset cancellation
    • Jun.
    • A. Bilotti, G. Monreal, and R. Vig, "Monolithic magnetic Hall sensor using dynamic quadrature offset cancellation," IEEE J. Solid-State Circuits, vol. 32, no. 6, pp. 829-836, Jun. 1997.
    • (1997) IEEE J. Solid-state Circuits , vol.32 , Issue.6 , pp. 829-836
    • Bilotti, A.1    Monreal, G.2    Vig, R.3
  • 11
    • 0025699013 scopus 로고
    • A low-offset spinning-current Hall plate
    • Mar.
    • P. Munter, "A low-offset spinning-current Hall plate," Sens. Actuators, vol. A21-A23, pp. 743-746, Mar. 1990.
    • (1990) Sens. Actuators , vol.A21-A23 , pp. 743-746
    • Munter, P.1
  • 12
    • 0008717987 scopus 로고    scopus 로고
    • Low-offset low-noise 3.5 mW CMOS spinning-current Hall effect sensor with integrated chopper amplifier
    • Sep.
    • A. Bakker, A. Bellekom, S. Middelhoek, and J. H. Huijsing, "Low-offset low-noise 3.5 mW CMOS spinning-current Hall effect sensor with integrated chopper amplifier," in Proc. Eurosensors XIII, Sep. 1999, pp. 1045-1048.
    • (1999) Proc. Eurosensors , vol.13 , pp. 1045-1048
    • Bakker, A.1    Bellekom, A.2    Middelhoek, S.3    Huijsing, J.H.4
  • 13
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effects of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization
    • Nov.
    • C. Enz and T. Gabor, "Circuit techniques for reducing the effects of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization," IEEE J. Solid-State Circuits, vol. 84, no. 11, pp. 1584-1614, Nov. 1996.
    • (1996) IEEE J. Solid-state Circuits , vol.84 , Issue.11 , pp. 1584-1614
    • Enz, C.1    Gabor, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.