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Volumn , Issue 462, 1999, Pages 51-56
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Solid state solutions for electricity metrology
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALOG TO DIGITAL CONVERSION;
CALIBRATION;
COST EFFECTIVENESS;
ELECTRIC UTILITIES;
HIGH TEMPERATURE TESTING;
RELIABILITY;
SEMICONDUCTOR DEVICE MANUFACTURE;
SEMICONDUCTOR DEVICE TESTING;
SIGNAL PROCESSING;
TRANSDUCERS;
SOLID STATE ELECTRICITY METERS;
ELECTRIC MEASURING INSTRUMENTS;
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EID: 0032668802
PISSN: 05379989
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1049/cp:19990106 Document Type: Article |
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Times cited : (8)
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References (0)
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