Low-noise Silicon-On-Insulator Hall devices

Fluctuation and Noise Letters

Volumn 4, Issue 2, 2004, Pages

  Haddab, Y ^a,c   Mosser, V ^a   Lysowec, M ^a   Suski, J ^a   Demeus, L ^b,d   Renaux, C ^b,d   Adriaensen, S ^b   Flandre, D ^b  

^a SCHLUMBERGER   (France)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^c Wavecom SA   (France)

^d CISSOID SA   (Belgium)

Author keywords

2D conduction; Hall cross; Hall effect; LOCOS; Low frequency noise; Magnetic sensitivity; Noise reduction; Sensors; Shape effect; SOI technology

Indexed keywords

EID: 12144252791     PISSN: 02194775     EISSN: None     Source Type: Journal    
DOI: 10.1142/S021947750400194X     Document Type: Article

References (12)

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