Characterization of aluminium nitride nanostructures by XANES and FTIR spectroscopies with synchrotron radiation

Journal of Physics Condensed Matter

Volumn 18, Issue 33, 2006, Pages

  Balasubramanian, C ^a,b   Bellucci, S ^a   Cinque, G ^a   Marcelli, A ^a   Cestelli Guidi, M ^a   Piccinini, M ^a,c   Popov, A ^d   Soldatov, A ^e   Onorato, P ^a,c  

^a INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

^c ROMA TRE UNIVERSITY   (Italy)

^d INSTITUT LAUE LANGEVIN   (France)

^e SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ALUMINUM NITRIDE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHONONS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

BAND-GAP SEMICONDUCTORS; FTIR SPECTROSCOPIES; INFRARED (IR) ABSORPTION; X-RAY ABSORPTION (XRS);

NANOSTRUCTURED MATERIALS;

EID: 33746877928     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/33/S25     Document Type: Article

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