Raman measurements on thin films of the La0.7Sr 0.3MnO3 manganite: A probe of substrate-induced effects

European Physical Journal B

Volumn 48, Issue 2, 2005, Pages 255-258

  Dore, P ^a   Postorino, P ^a   Sacchetti, A ^a   Baldini, M ^a   Giambelluca, R ^a   Angeloni, M ^b   Balestrino, G ^b  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^b UNIVERSITY OF ROME TOR VERGATA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCIES; LANTHANUM COMPOUNDS; MANGANESE COMPOUNDS; PHONONS; RAMAN SPECTROSCOPY; THERMAL EFFECTS;

BENDING MODES; FILM THICKNESS; MANGANITE; RAMAN MEASUREMENTS;

THIN FILMS;

EID: 29144497382     PISSN: 14346028     EISSN: 14346036     Source Type: Journal    
DOI: 10.1140/epjb/e2005-00401-3     Document Type: Article

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