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Volumn 55, Issue 4, 2005, Pages 387-393

White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion

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Indexed keywords


EID: 33746800667     PISSN: 03230465     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (23)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.