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Volumn 55, Issue 4, 2005, Pages 387-393
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White-light spectral interferometry to measure the effective thickness of optical elements of known dispersion
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33746800667
PISSN: 03230465
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (23)
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References (20)
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