Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target

Optics Letters

Volumn 21, Issue 7, 1996, Pages 528-530

  Schnell, U ^a   Dandliker R ^a   Gray, S ^b  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^b Holtronic Technologies   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000587172     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000528     Document Type: Article

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