Spectral interferometry including the effect of transparent thin films to measure distances and displacements

Acta Physica Slovaca

Volumn 54, Issue 3, 2004, Pages 213-220

  Hlubina, P ^a  

^a SILESIAN UNIVERSITY IN OPAVA   (Czech Republic)

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EID: 33645217379     PISSN: 03230465     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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