Slightly dispersive white-light spectral interferometry to measure distances and displacements

Optik

Volumn 114, Issue 9, 2003, Pages 389-393

  Hlubina, Petr ^a   Gurov, Igor ^b   Chugunov, Vladimir ^b  

^a SILESIAN UNIVERSITY IN OPAVA   (Czech Republic)

^b ITMO UNIVERSITY   (Russian Federation)

Author keywords

Displacement; Distance; Low dispersion; Non linear phase function; Spectral interferometry

Indexed keywords

CURVE FITTING; DISTANCE MEASUREMENT; FOURIER TRANSFORMS; FUSED SILICA; INTERFEROMETERS; LIGHT INTERFERENCE; MIRRORS; MOIRE FRINGES; OPTICAL BEAM SPLITTERS; OPTICAL COATINGS; REFRACTIVE INDEX;

DISPLACEMENT; LOW DISPERSION; NONLINEAR PHASE FUNCTION; SLIGHTLY DISPERSIVE WHITE-LIGHT SPECTRAL INTERFEROMETRY;

INTERFEROMETRY;

EID: 0347133499     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00281     Document Type: Article

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