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Volumn 16, Issue SUPPL., 2006, Pages

Effects of two-step annealing on properties of Cd1-xZnxTe single crystals

Author keywords

Cd1 xZnxTe single crystal; Defects; Impurities; Semiconducting II VI materials

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; EFFECTS; EXCITONS; IMPURITIES; POINT DEFECTS; RESIDUAL STRESSES; SINGLE CRYSTALS;

EID: 33746798931     PISSN: 10036326     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1003-6326(06)60169-6     Document Type: Article
Times cited : (6)

References (11)
  • 3
    • 0001085695 scopus 로고    scopus 로고
    • Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality
    • SEN S, LIANG C S, RHIGER D R, STANNARD J E. Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality [J]. J Electron Mater, 1996, 25: 1188-1195.
    • (1996) J Electron Mater , vol.25 , pp. 1188-1195
    • Sen, S.1    Liang, C.S.2    Rhiger, D.R.3    Stannard, J.E.4
  • 4
    • 9744226554 scopus 로고    scopus 로고
    • Impurities in CdZnTe crystal grown by vertical bridgman method
    • LI Guo-qiang, JIE Wan-qi, WANG Tao, YANG Ge. Impurities in CdZnTe crystal grown by vertical bridgman method [J]. Nucl Instr and Meth A, 2004, 534: 511-517.
    • (2004) Nucl Instr and Meth A , vol.534 , pp. 511-517
    • Li, G.-Q.1    Jie, W.-Q.2    Wang, T.3    Yang, G.4
  • 6
    • 0031344202 scopus 로고    scopus 로고
    • Study on crystalline quality of Cd-annealing CdZnTe wafers grown by Bridgman method
    • Chinese source
    • ZHU Ji-qian, CHU Jun-hao, ZHANG Xiao-ping, LI Biao, CHENG Ji-jian. Study on crystalline quality of Cd-annealing CdZnTe wafers grown by Bridgman method [J]. Chinese Journal of Semiconductors, 1997, 18: 782-786. (in Chinese)
    • (1997) Chinese Journal of Semiconductors , vol.18 , pp. 782-786
    • Zhu, J.-Q.1    Chu, J.-H.2    Zhang, X.-P.3    Li, B.4    Chen, J.-J.5
  • 7
    • 33746843450 scopus 로고    scopus 로고
    • xTe crystals and the heat treatment of wafers
    • Xi'an: Northwestern Polytechnical University
    • xTe Crystals and the Heat Treatment of Wafers [D]. Xi'an: Northwestern Polytechnical University, 2002.
    • (2002)
    • Li, Y.-J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.