Ferroelectric thin films obtained by pulsed laser deposition

Journal of the European Ceramic Society

Volumn 26, Issue 14, 2006, Pages 2937-2943

  Purice, A ^a   Dinescu, G ^a   Scarisoreanu, N ^a   Verardi, P ^b   Craciun, F ^c   Galassi, C ^d   Dinescu, M ^a  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

^b CNR   (Italy)

^c ISC CNR   (Italy)

^d INSTITUTE OF SCIENCE AND TECHNOLOGY FOR CERAMICS   (Italy)

Author keywords

Ferroelectric properties; Films; Grain boundaries; PLZT; PZT

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC THIN FILMS; FERROELECTRICITY; GRAIN BOUNDARIES; HYSTERESIS; PRESSURE EFFECTS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DEPOSITION PARAMETERS; FERROELECTRIC HYSTERESIS; FERROELECTRIC PROPERTIES; FILM PROPERTIES;

FERROELECTRIC CERAMICS;

ATOMIC FORCE MICROSCOPY; FERROELECTRIC CERAMICS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; GRAIN BOUNDARIES; HYSTERESIS; PRESSURE EFFECTS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 33746724796     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2006.02.027     Document Type: Article

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