Structural and electrical characterization of PLZT 22/20/80 relaxor films obtained by PLD and RF-PLD

Applied Surface Science

Volumn 248, Issue 1-4, 2005, Pages 329-333

  Craciun, F ^a   Dinescu, M ^b   Verardi, P ^c   Scarisoreanu, N ^b   Moldovan, A ^b   Purice, A ^b   Galassi, C ^d  

^a ISC CNR   (Italy)

^b NATIONAL INSTITUTE FOR LASER   (Romania)

^c CNR   (Italy)

^d INSTITUTE OF SCIENCE AND TECHNOLOGY FOR CERAMICS   (Italy)

Author keywords

Dielectric properties; Films; PLD; PLZT; Relaxor

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; DIELECTRIC PROPERTIES OF SOLIDS; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; TUNING; X RAY DIFFRACTION;

LONG-RANGE CORRELATIONS; NANODOMAINS; PLZT; RELAXORS;

THIN FILMS;

EID: 19944424143     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.03.080     Document Type: Conference Paper

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