Analog circuit observer blocks

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 44, Issue 3, 1997, Pages 154-163

  Harjani, Ramesh ^a   Vinnakota, Bapiraju ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Analog test, code based test, design for test, 1c test, mixed signal test

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPUTER SIMULATION; ERROR DETECTION; INTEGRATED CIRCUIT TESTING; MEASUREMENT ERRORS; SEMICONDUCTOR DEVICE STRUCTURES; SIGNAL NOISE MEASUREMENT;

ANALOG CIRCUIT OBSERVER BLOCKS; ANALOG TEST; CODE BASED TEST; MEASUREMENT INDUCED ERRORS; MIXED SIGNAL TEST;

LINEAR INTEGRATED CIRCUITS;

EID: 0031100268     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.558450     Document Type: Article

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