High-resolution mapping of the optical near-field components at a triangular nano-aperture

Optics Express

Volumn 13, Issue 26, 2005, Pages 10688-10696

  Molenda, D ^a   Colas Des Francs, G ^b   Fischer, U C ^a   Rau, N ^c   Naber, A ^c  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b UNIVERSITÉ DE BOURGOGNE   (France)

^c UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; FLUORESCENCE; NANOSTRUCTURED MATERIALS; SCANNING;

ALUMINUM FILMS; OPTICAL NEAR-FIELD COMPONENTS; SCANNING NEAR-FIELD OPTICAL MICROSCOPE (SNOM); TRIANGULAR APERTURE;

OPTICAL MATERIALS;

EID: 29244476005     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.010688     Document Type: Article

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