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Volumn 3, Issue , 2006, Pages 1709-1712
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High temperature characterization of Pt-based Schottky diodes on AlGaN/GaN heterostructures
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Author keywords
[No Author keywords available]
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Indexed keywords
I-V-T MEASUREMENTS;
PT/AU CASE;
SLIGHT DEGRADATION;
THERMAL CYCLE;
68.60.DV;
ALGAN/GAN HETEROSTRUCTURES;
DIODE PARAMETERS;
EFFECTIVE BARRIER HEIGHTS;
IDEALITY FACTORS;
INCREASING TEMPERATURES;
INTERMEDIATE LAYERS;
SCHOTTKY CONTACTS;
GALLIUM NITRIDE;
HETEROJUNCTIONS;
THERMODYNAMIC STABILITY;
PLATINUM;
SCHOTTKY BARRIER DIODES;
SCHOTTKY BARRIER DIODES;
GALLIUM NITRIDE;
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EID: 33746375348
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200565225 Document Type: Conference Paper |
Times cited : (12)
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References (8)
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