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Volumn 3, Issue , 2006, Pages 1709-1712

High temperature characterization of Pt-based Schottky diodes on AlGaN/GaN heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

I-V-T MEASUREMENTS; PT/AU CASE; SLIGHT DEGRADATION; THERMAL CYCLE; 68.60.DV; ALGAN/GAN HETEROSTRUCTURES; DIODE PARAMETERS; EFFECTIVE BARRIER HEIGHTS; IDEALITY FACTORS; INCREASING TEMPERATURES; INTERMEDIATE LAYERS; SCHOTTKY CONTACTS;

EID: 33746375348     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200565225     Document Type: Conference Paper
Times cited : (12)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.