Spectroellipsometric characterization of Au-Y2O3-stabilized ZrO2 nanocomposite films

Journal of Materials Research

Volumn 20, Issue 12, 2005, Pages 3320-3328

  Sirinakis, George ^a   Siddique, Rezina ^a   Dunn, Kathleen A ^a   Efstathiadis, Harry ^a   Carpenter, Michael A ^a   Kaloyeros, Alain E ^a   Sun, Lianchao ^b  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b Angstrom Sun Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; GOLD; MAGNETRON SPUTTERING; PARTICLE SIZE ANALYSIS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS; ZIRCONIA;

NANOCOMPOSITE THIN FILMS; SPECTROELLIPSOMETRIC CHARACTERIZATION; YTTRIA-STABILIZED ZIRCONIA (YSZ);

NANOSTRUCTURED MATERIALS;

EID: 30444452501     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2005.0411     Document Type: Article

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