Thin film transmission matrix approach to fourier transform infrared analysis of HgCdTe multilayer heterostructures

Journal of Electronic Materials

Volumn 35, Issue 6, 2006, Pages 1487-1490

  Lofgreen, D D ^a   Peterson, C M ^a   Buell, A A ^a   Vilela, M F ^a   Johnson, S M ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

Bandgap; Fourier transform infrared spectroscopy (FTIR); Hg 1 xCd xTe (MCT); Refractive index; Transmission matrix

Indexed keywords

BANDGAPS; HGCDTE (MCT); OPERATING TEMPERATURES; TRANSMISSION MATRIX;

ALGORITHMS; CADMIUM; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERMETALLICS; MATHEMATICAL MODELS; MERCURY (METAL); MOLECULAR BEAM EPITAXY; OPTIMIZATION; QUANTUM THEORY; REFRACTIVE INDEX; TELLURIUM; THERMAL EFFECTS;

THIN FILMS;

EID: 33746191894     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0289-4     Document Type: Conference Paper

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