High-precision methods and devices for in situ measurements of thermally induced aberrations in optical elements

Applied Optics

Volumn 45, Issue 17, 2006, Pages 4092-4101

  Zelenogorsky, Victor V ^a   Solovyov, Alexander A ^a   Kozhevatov, Ilya E ^a   Kamenetsky, Eugene E ^a   Rudenchik, Eugene A ^a   Palashov, Oleg V ^a   Silin, Dmitry E ^a   Khazanov, Efim A ^a  

^a INSTITUTE OF APPLIED PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LIGHT INTERFERENCE; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; OPTICAL CHARACTER RECOGNITION; OPTICAL SENSORS; TELECONTROL EQUIPMENT;

BROADBAND OPTICAL INTERFEROMETERS; REMOTE MEASUREMENTS; SCANNING HARTMANN SENSORS; SURFACE HEATING;

OPTICAL DEVICES;

EID: 33746130741     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.004092     Document Type: Article

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