Absolute testing of the profiles of large-size flat optical surfaces

Radiophysics and Quantum Electronics

Volumn 44, Issue 7, 2001, Pages 575-581

  Kozhevatov, I E ^a   Rudenchik, E A ^a   Cheragin, N P ^a   Kulikova, E Kh ^a  

^a LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON OPTICS; MAGNETIC MATERIALS;

ABSOLUTE TESTING; FUNDAMENTAL CONSTRAINTS; MEASUREMENT METHODS; OPTICAL SURFACES; REAL-TIME TESTING; SURFACE PROFILES; WHITE-LIGHT INTERFEROMETER; WHITE-LIGHT INTERFEROMETRY;

INTERFEROMETERS;

EID: 1642455385     PISSN: 00338443     EISSN: 15739120     Source Type: Journal    
DOI: 10.1023/A:1017970119292     Document Type: Article

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