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Volumn 32, Issue 8, 1996, Pages
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Diffraction methods raise interferometer accuracy
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Author keywords
[No Author keywords available]
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Indexed keywords
CAMERAS;
CHARGE COUPLED DEVICES;
DIFFRACTION;
FABRICATION;
INTERFEROMETERS;
INTERFEROMETRY;
OPTICAL DESIGN;
OPTICAL FIBERS;
OPTICAL VARIABLES MEASUREMENT;
OPTICS;
PHOTOLITHOGRAPHY;
PROJECTION SYSTEMS;
NUMERICAL APERTURE;
WAVELENGTH;
OPTICAL TESTING;
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EID: 0030214806
PISSN: 07402511
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (35)
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References (0)
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