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Volumn 73, Issue 1, 2006, Pages 35-42
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Nano-roughness assessment by light scattering measurement;Bewertung von nanorauheiten durch streulichtmessung
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Author keywords
Functional surfaces; Light scattering; Metrology; Nanostructure; Roughness
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Indexed keywords
FUNCTIONAL PARAMETERS;
FUNCTIONAL SURFACES;
LIGHT SCATTERING MEASUREMENT;
LIGHT SCATTERING TECHNIQUES;
MEASUREMENT TECHNIQUES;
NANOROUGHNESS;
INSTRUMENTS;
MEASUREMENTS;
NANOSTRUCTURES;
SURFACE ROUGHNESS;
LIGHT SCATTERING;
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EID: 33746067147
PISSN: 01718096
EISSN: 01718096
Source Type: Journal
DOI: 10.1524/teme.2006.73.1.35 Document Type: Article |
Times cited : (3)
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References (10)
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