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Volumn 73, Issue 1, 2006, Pages 35-42

Nano-roughness assessment by light scattering measurement;Bewertung von nanorauheiten durch streulichtmessung

Author keywords

Functional surfaces; Light scattering; Metrology; Nanostructure; Roughness

Indexed keywords

FUNCTIONAL PARAMETERS; FUNCTIONAL SURFACES; LIGHT SCATTERING MEASUREMENT; LIGHT SCATTERING TECHNIQUES; MEASUREMENT TECHNIQUES; NANOROUGHNESS;

EID: 33746067147     PISSN: 01718096     EISSN: 01718096     Source Type: Journal    
DOI: 10.1524/teme.2006.73.1.35     Document Type: Article
Times cited : (3)

References (10)
  • 1
    • 4444259087 scopus 로고    scopus 로고
    • Untersuchungen der mikro- und nanorauigkeit von oberflächen mittels streulichtmessung
    • VDT-Berichte 1669, Düsseldorf
    • A. Duparŕ: Untersuchungen der Mikro- und Nanorauigkeit von Oberflächen mittels Streulichtmessung. In: Metrologie in der Mikro- und Nanotechnik, VDT-Berichte 1669, Düsseldorf 2003, S. 43.
    • (2003) Metrologie in der Mikro- und Nanotechnik , pp. 43
    • Duparŕ, A.1
  • 3
    • 0003323242 scopus 로고
    • Introduction to surface roughness and scattering
    • Wash. DC
    • J. M. Bennett, L. Mattson: Introduction to Surface Roughness and Scattering. Opt. Soc. of Am., Wash. DC 1989.
    • (1989) Opt. Soc. of Am.
    • Bennett, J.M.1    Mattson, L.2
  • 4
    • 0036285061 scopus 로고    scopus 로고
    • Surface characterization techniques for determining rms roughness and power spectral densities of optical components
    • A. Duparré, J. Ferré-Borrull, S. Gliech, G. Notni, J. Steinert und J. M. Bennett: Surface characterization techniques for determining rms roughness and power spectral densities of optical components. - In: Appl. Opt. 41(2002), S. 154-171.
    • (2002) Appl. Opt. , vol.41 , pp. 154-171
    • Duparré, A.1    Ferré-Borrull, J.2    Gliech, S.3    Notni, G.4    Steinert, J.5    Bennett, J.M.6
  • 7
    • 27844531025 scopus 로고    scopus 로고
    • Measurement system to determine the total and angle resolved light scattering of optical components in the deepultraviolet and vacuum-ultraviolet spectral regions
    • S. Schröder, S. Gliech und A. Duparré: Measurement system to determine the total and angle resolved light scattering of optical components in the deepultraviolet and vacuum-ultraviolet spectral regions. In: Appl. Opt. 44 (2005), S. 6093-6107.
    • (2005) Appl. Opt. , vol.44 , pp. 6093-6107
    • Schröder, S.1    Gliech, S.2    Duparré, A.3
  • 9
    • 84911475667 scopus 로고    scopus 로고
    • Scattering from surfaces and thin films
    • R.D. Guenther et al., Elsevier, Oxford
    • A. Duparré: Scattering from Surfaces and Thin Films. - In: Encyclopedia of Modern Optics. R.D. Guenther et al., Elsevier, Oxford (2004), S. 314-321.
    • (2004) Encyclopedia of Modern Optics , pp. 314-321
    • Duparré, A.1
  • 10
    • 33746100419 scopus 로고    scopus 로고
    • Nanorauheit statt lotusstruktur: Chancen für ultrahydrophobe optische oberflächen
    • A. Duparré, M. Flemming, G. Notni und A. Ttinnermann: Nanorauheit statt Lotusstruktur: Chancen für ultrahydrophobe optische Oberflächen. - In: Photonik 2 (2005), S. 62-65.
    • (2005) Photonik , vol.2 , pp. 62-65
    • Duparré, A.1    Flemming, M.2    Notni, G.3    Ttinnermann, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.