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Volumn 130-131, Issue SPEC. ISS., 2006, Pages 609-615

Fabrication of pyramid shaped three-dimensional 8 × 8 electrodes for artificial retina

Author keywords

Artificial vision; Microelectrode array; Three dimensional electrode

Indexed keywords

ARRAYS; COMPUTER VISION; SIGNAL TO NOISE RATIO; TWO DIMENSIONAL;

EID: 33745866588     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2005.11.070     Document Type: Article
Times cited : (28)

References (9)
  • 1
    • 0036687949 scopus 로고    scopus 로고
    • Silicon nitride cantilever with oxidation-sharpened silicon tips for atomic force microscopy
    • Grow R.J., Minne S.C., Manalis S.R., and Quate C.F. Silicon nitride cantilever with oxidation-sharpened silicon tips for atomic force microscopy. J. Microelectromech. Syst. 11 (2002) 317-321
    • (2002) J. Microelectromech. Syst. , vol.11 , pp. 317-321
    • Grow, R.J.1    Minne, S.C.2    Manalis, S.R.3    Quate, C.F.4
  • 2
    • 0033889018 scopus 로고    scopus 로고
    • Microfabricated small metal cantilevers with silicon tip for atomic force microscopy
    • Chand A., Viani M.B., Schaffer T.E., and Hansma P.K. Microfabricated small metal cantilevers with silicon tip for atomic force microscopy. J. Microelectromech. Syst. 9 (2000) 112-116
    • (2000) J. Microelectromech. Syst. , vol.9 , pp. 112-116
    • Chand, A.1    Viani, M.B.2    Schaffer, T.E.3    Hansma, P.K.4
  • 3
    • 0033905628 scopus 로고    scopus 로고
    • Air-bearing slides and plane-plane-concave tips for atomic force microscope cantilevers
    • Ried R.P., Mamin H.J., and Ruger D. Air-bearing slides and plane-plane-concave tips for atomic force microscope cantilevers. J. Microelectromech. Syst. 9 (2000) 52-56
    • (2000) J. Microelectromech. Syst. , vol.9 , pp. 52-56
    • Ried, R.P.1    Mamin, H.J.2    Ruger, D.3
  • 5
    • 84951951200 scopus 로고    scopus 로고
    • AFM probe tips using heavily boron-doped silicon cantilevers realized in a 〈1 1 0〉 bulk silicon wafer
    • Tokyo, Japan
    • Cho I.-J., Park E.-C., and Yoon E. AFM probe tips using heavily boron-doped silicon cantilevers realized in a 〈1 1 0〉 bulk silicon wafer. Proceedings of the Microprocesses and Nanotechnology Conference. Tokyo, Japan (July 11-13, 2000) 230-231
    • (2000) Proceedings of the Microprocesses and Nanotechnology Conference , pp. 230-231
    • Cho, I.-J.1    Park, E.-C.2    Yoon, E.3
  • 7
    • 68849100261 scopus 로고    scopus 로고
    • A novel fabrication process for ultra-sharp high-aspect ratio nano tips using (1 1 1) single crystalline silicon
    • Boston, USA
    • Park J., Park K., Choi B., Koo K., Paik S., Park S., Kim J., and Cho D. A novel fabrication process for ultra-sharp high-aspect ratio nano tips using (1 1 1) single crystalline silicon. Proceedings of the Transducers 2003. Boston, USA (June 8-12, 2003) 1144-1145
    • (2003) Proceedings of the Transducers 2003 , pp. 1144-1145
    • Park, J.1    Park, K.2    Choi, B.3    Koo, K.4    Paik, S.5    Park, S.6    Kim, J.7    Cho, D.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.