Observation of a (√3 × √3)-R30° reconstruction on GaN(0 0 0 1) by RHEED and LEED

Surface Science

Volumn 600, Issue 14, 2006, Pages 169-174

  Wang, J ^a   So, Ricky ^a   Liu, Y ^a   Wu, Huasheng ^a   Xie, M H ^a   Tong, S Y ^b  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Low energy electron diffraction; Surface reconstructions

Indexed keywords

COMPUTER SIMULATION; FILM GROWTH; GALLIUM NITRIDE; LOW ENERGY ELECTRON DIFFRACTION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TENSORS;

AREA RATIO; CURVES SIMULATIONS; SURFACE RECONSTRUCTIONS; TOTAL ENERGY;

SEMICONDUCTING FILMS;

EID: 33745818334     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.04.046     Document Type: Article

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