Characterization of periodically nanostructured copper filaments self-organized by electrodeposition

Journal of Physics Condensed Matter

Volumn 18, Issue 23, 2006, Pages 5425-5434

  Wu, Zhe ^a   Bao, Yong Jun ^a   Yu, Guang Wei ^b   Wang, Mu ^a   Peng, Ru Wen ^a   Fleury, Vincent ^c   Hao, Xi Ping ^a   Ming, Nai Ben ^a  

^a NANJING UNIVERSITY   (China)

^b SHANDONG UNIVERSITY   (China)

^c LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENT CARRYING CAPACITY (CABLES); ELECTRIC PROPERTIES; ELECTRODEPOSITION; NANOSTRUCTURED MATERIALS; OSCILLATIONS; SPECTROSCOPIC ANALYSIS;

CONDUCTING ATOMIC FORCE MICROSCOPE (CAFM); CURRENT IMAGING TUNNELLING SPECTROSCOPY (CITS); NANOSTRUCTURED COPPER FILAMENTS;

COPPER;

EID: 33745764838     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/23/014     Document Type: Article

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